For cards and readers used in fare connection applications, KEOLABS provides off-the shelf solutions to verify conformity to relevant transport standards. KEOLABS ISO 10373-6 Analog & Digital Testing Solutions are available to user for "in house" evaluation of their products during development before engaging in a format certification, conformance verification standards ensure the ISO/IEC 14443 interoperability between a card/ticket/smart objects and a reader.
The ISO 10373-6 testing system provides the following testing suites:
ISO10373-6 PICC Analog test suite
ISO10373-6 PICC Digital test suite
ISO10373-6 PCD Analog test suite
ISO10373-6 PCD Digital test suite
For cards and readers used in fare connection applications, KEOLABS provides off-the shelf solutions to verify conformity to relevant transport standards.
KEOLABS ISO 10373-6 Analog & Digital Testing Solutions are available to user for "in house" evaluation of their products during development before engaging in a format certification, conformance verification standards ensure the ISO/IEC 14443 interoperability between a card/ticket/smart objects and a reader.
• ISO/IEC 10373-6 Test Methods
1 SCRIPTIS™ Test Environment
1 ISO 10373-6 Analog test suite
1 ISO 10373-6 Digital test suite
1 ProxiLAB QUEST tester with PCD Analog and Digital (PCD VHBR optional)
SC-PCD Assembly-4R7 (ISO PCD Assembly 1): ProxiLAB ISO 10373-6 High speed Test PCD Assembly (Rext 4,7 Ohm Version, latest ISO 10373-6 proposal). Used to perform Layer 2 ISO 14443 tests.
SC-PCD Assembly-1 R (ISO PCD Assembly 1): ProxiLAB ISO 10373-6 Low speed Test PCD Assembly (Rext 1 Ohm Version). Used to perform Layer 1 ISO 14443 tests (AMF tests).
SC-PCD Assembly-2R7 (ISO PCD Assembly 2): High speed test PCD assembly class 4-6. PCD Antenna and sensing coils for high speed (RExt: 4.7 Ohm) testing of contactless smart cards according to ISO 10373-6
SC-RefPICC-KIT-CLASS1-6: 10373-6 PICC Reference probes, Classes 1-6. PICC reference probe kit with probes for classes 1 to 6 allowing testing of contactless readers according to ISO 10373-6 standards
1 Lecroy HDO 6034-B Oscilloscope with Xdev option
1 Amplifier 50W, 10-250 MHz
This PICC Analog test suite is compatible with the following standard: ISO/IEC 10373-6:2020 standard for Type A and Type B
Our coverage of this test specification includes the following test cases (numbering according
to the ISO/IEC 10373-6:2020):
ISO/IEC 14443-1 parameters tests:
• §6.2.1 - Alternating magnetic field
ISO/IEC 14443-2 parameters tests::
• §7.2.1 - PICC transmission
• §7.2.2 - PICC EMD level and low EMD time test
• §7.2.3 - PICC reception
• §7.2.4 - PICC resonance frequency
• §7.2.5 - PICC maximum loading effect
• §7.2.6 - PICC operating field strength
This PICC Analog test suite is compatible with the following standard: ISO/IEC 10373-6:2020 standard for Type A and Type B
Our coverage of this test specification includes the following test cases (numbering according
to the ISO/IEC 10373-6:2020):
Type A initialization tests:
• §G.3.2 – Scenario G.1 Polling Type A
• §G.3.3 – Testing of the PICC Type A state transitions
• §G.3.4 – Handling of Type A anti-collision
• §G.3.5 – Handling of RATS
• §G.3.6 – Handling of PPS request
• §G.3.7 – Handling of FSD
• §G.3.8 – Handling of Frame Delay Time PICC to PCD and SFGT
• §G.3.9 – PICC bit rates capability
Type B initialization tests:
• §G.4.2 – Scenario G.1 Polling Type B
• §G.4.3 – Scenario G.22: PICC framing and bit rates capability
• §G.4.4 – Testing of the PICC Type B state transitions
• §G.4.5 – Scenario G.28: Handling of Type B anticollision
• §G.4.6 – Handling of ATTRIB
• §G.4.7 – Scenario G.31: Handling of Maximum Frame Size
• §G.4.8 – Scenario G.31: Handling of TR2 and SFGT
Type A or type B logical operation tests:
• §G.3.7/G4.7 – Handling of Maximum Frame size
• §G.5.2 – PICC reaction to ISO/IEC 14443-4 Scenarios
• §G.5.3 – Handling of PICC error detection
• §G.5.4 – PICC reaction on CID
• §G.5.5 – PICC reaction on NAD
• §G.5.6 – PICC reaction on S(PARAMETERS) blocks
• §G.5.7 – PICC supporting Type A and Type B
Scriptis supports Python editing and modifying scripts:
Scriptis saves test logs in TXT format:
Scriptis saves test logs in xgpa format:
Scriptis saves test logs in xdata format:
Scriptis supports exporting reports in PDF format:
Scriptis supports exporting reports in html format:
The Keolabs Solution by ABE supports verifying the following standards:
• EMV® Type Approval - Contactless Terminal Level 1
• EMV® Type Approval - Contactless Card Level 1
• NFC Forum Test Cases for Analog and Digital Protocol
• ISO/IEC 10373-6 Test Methods
• ISO/IEC 18745-2 Test Methods for the contactless interface
• CEN/TS 16794-2:2017 Public transport - Communication between contactless readers and fare media - Part 2: Test plan for ISO/IEC 14443
KEOLABS provides a complete testing solution that supports internal validation of smart cards and card readers based on industry standards for specific application types, including:
• Payment: Qualified solution to verify you payment applications - Used by EMVCo Laboratories
EMVCo Level 1 PCD Analog Test Suite
EMVCo Level 1 PCD Digital Test Suite
EMVCo Level 1 Reduced Range Terminal Analog Test Suite
EMVCo Level 1 PICC Analog Test Suite
EMVCo Level 1 PICC Digital Test Suite
EMVCo Level 1 Mobile Analog Test Suite
• ePassport & eID Products: Solution to verify your Identity Applications - Used by National Printing Companies
ISO 10373-6/ISO 18745-2 PICC Analog Test Suite
ISO 10373-6/ISO 18745-2 PICC Digital Test Suite
ePassport-eMRTD Application Test Suite
eID - Application EAC V2 & IAS ECC Test suites
eDL - Application ISO 18013-4 Test suite
• Access Control, Transport & Smart Objects: Solution to verify your Transport or Access Control Applications - Used by transport operators
ISO 10373-6 PICC Analog Test Suite
ISO 10373-6 PICC Digital Test Suite
ISO 10373-6 PCD Analog Test Suite
ISO 10373-6 PCD Digital Test Suite
• Mobile, Automotive Makers: Qualified solution to Verify your NFC Applications - Used by Mobile or automotive Makers
NFC Forum Poller&Listener Analog Test Suite
NFC Forum Poller&Listener Digital Test Suite
NFC Forum LLCP/SNEP test suite(Initiator/Target)
Current Products:ISO 10373-6 Test Solutions
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