KEOLABS offers off-the-shelf solutions to verify conformity of NFC enabled objects and systems to relevant standards including NFC forum.
The NFC Forum testing system provides the following testing suites:
Poller&Listener Analog NFC Forum test suite
Poller&Listener Digital NFC Forum test suite
Initiator&Target Applicative LLCP/SNEP test suite
KEOLABS offers off-the-shelf solutions to verify conformity of NFC enabled objects and systems to relevant standards including NFC forum.
The testing environment meets strict conformance requirements to NFC Forum standards for verifying analog, digital and application implementations in passive devices (cards, tags, mobiles, etc) and active systems (readers, mobiles).
The NFC Forum provides international test specifications for functional validation at the analog and protocol levels of phones, tags, devices and other systems implementing the NFC protocol in 13.56 Mhz contactless communications.These specifications are the foundation for ensuring the reliability and interoperability of NFC systems and devices.The NFC Forum specifications and derived testing solutions allow conformance assessment of:
• End-user contactless devices (smart cards (PICC), tags, keyfobs, NFC handsets)
• Packaged devices (inlays, modules)
• Embedded integrated circuits (hardware chips, secure elements)
KEOLABS provides complete testing solutions developed and qualified in accordance with NFC Forum requirements.
• NFC Forum Test Cases for Analog and Digital Protocol
1 SCRIPTIS™ Test Environment
1 Poller&Listener Analog NFC Forum test suite
1 Poller&Listener Digital NFC Forum test suite
1 Initiator&Target Applicative LLCP/SNEP test suite
1 ProxiLAB QUEST tester with PCD Analog and Digital options
SC-Poller-Listener-kit: Poller and Listener reference antennas for testing of NFC objects and systems
SC-NFC Forum Kit: In addition of the poller/listener antennas, KEOLABS provides a “calibration test bench” to calibrate the NFC antennas + a KEOKLAMP to maintain the antenna & the device.
1 Robot 6 axis with dedicated accessories (optional)
1 Lecroy HDO 6034-B Oscilloscope with Xdev option
1 Amplifier 50W, 10-250 MHz
This NFC FORUM Analog test suite is based on the standard: NFC Forum Test Cases for Analog Version which is compliant with the NFC Certification Release 13 (CR13)
Also included the Test Cases for Tag Performance Version - CR13
This solution is designed to test a device in all the NFC Forum operating volume in term of:
Poller Mode :
• Power Reception,
• Loading Effect Measurement,
• Carrier Frequency,
• Power ON and OFF,
• Excessive Field exposure,
• Modulation reception at limit conditions,
• Load Modulation Amplitude,
• Subcarrier Modulation.
Listener Mode :
• Minimum and Maximum Power Emission Measurement,
• Carrier Frequency,
• Reset Characteristics,
• Threshold Level,
• Field Activation and Deactivation,
• Modulation Measurement,
• Load Modulation Amplitude Reception.
This NFC FORUM Digital test suite is based on the standard: NFC Forum Test Cases for Digital Protocol Version which is compliant with the NFC Certification Release 13
Also included the Test Cases for Type 2, 3, 4, and 5 Tag and Type 2, 3, 4, and 5 Tag Operation – Version CR13
This solution is designed to test a device in term of:
Poller Mode:
• Group 1: Installation of NFC Forum ACM Device with NFC-A, NFC-B, and NFC-F Technology
• Group 2: NFC Forum Device in Poll Mode
Group 2.1: Installation of NFC Forum Device with NFC-A Technology
Group 2.2: Installation of NFC Forum Device with NFC-B Technology
Group 2.3: Installation of NFC Forum Device with NFC-F Technology
Group 2.4: Installation of NFC Forum Device with NFC-V Technology
Group 2.5: Type 1 Tag (T1T) Platform
Group 2.6: Type 2 Tag (T2T) Platform
Group 2.7: Type 3 Tag (T3T) Platform
Group 2.8: Type 4A Tag (T4AT) Platform
Group 2.9: Type 4B Tag (T4BT) Platform
Group 2.10: Type 5 Tag (T5T) Platform
Group 2.11: Peer–to-Peer with NFC-A
Group 2.12: Peer–to-Peer with NFC-F
Group 2.13: Peer–to-Peer ACM
• Tag Operation
Versioning
Reading and Writing Tests
Timing Verification
State Transition
Write on Read-Only Tests
Listener Mode :
• Group 3: NFC Forum Device in Listen Mode
Group 3.1: Installation of NFC Forum Device with NFC-A Technology
Group 3.2: Installation of NFC Forum Device with NFC-B Technology
Group 3.3: Installation of NFC Forum Device with NFC-F Technology
Group 3.4: Type 3 Tag (T3T) Platform
Group 3.5: Type 4A Tag (T4AT) and Type 4B Tag (T4BT) Platform
Group 3.6: Type 5 Tag (T5T) Platform
Group 3.7: Peer–to-Peer with NFC-A
Group 3.8: Peer–to-Peer with NFC-F
Group 3.9: Peer–to-Peer ACM
• Tag Application
Reading and Writing Tests
State transition
Locking Tests
Write on Read-Only Tests
This NFC FORUM LLCP/SNEP test suite is based on the standard:
NFC Forum Test Cases for LLCP 1.2.03 (2020-03-26)
NFC Forum Test Cases for SNEP Version 1.0.07 (2020-03-19)
This solution is designed to test a device in term of:
LLCP:
• Group 1: MAC Link Layer
Group 1.1: MAC Link Activation and Deactivation
Group 1.2: LLC Activation
Group 1.3: Normal Phase
Group 1.4: LLC Deactivation
Group 1.5: Symmetry Procedure
• Group 2: Connectionless Transport Mode Tests
Group 2.1: Information Transfer
• Group 3: Connection-Oriented Mode Tests
Group 3.1: Connection Establishment
Group 3.2: Information Transfer
Group 3.3: Receiver Busy Condition
Group 3.4: Connection Termination
• Group 4: Aggregation Tests
SNEP :
• Client Tests
Basic Interconnection Tests
Put NDEF Message
Get NDEF Message
• Server Tests
Basic Interconnection Tests
Accept NDEF Message
Return NDEF Message
Scriptis supports Python editing and modifying scripts:
Scriptis saves test logs in TXT format:
Scriptis saves test logs in xgpa format:
Scriptis saves test logs in xdata format:
Scriptis supports exporting reports in PDF format:
Scriptis supports exporting reports in html format:
The Keolabs Solution by ABE supports verifying the following standards:
• EMV® Type Approval - Contactless Terminal Level 1
• EMV® Type Approval - Contactless Card Level 1
• NFC Forum Test Cases for Analog and Digital Protocol
• ISO/IEC 10373-6 Test Methods
• ISO/IEC 18745-2 Test Methods for the contactless interface
• CEN/TS 16794-2:2017 Public transport - Communication between contactless readers and fare media - Part 2: Test plan for ISO/IEC 14443
KEOLABS provides a complete testing solution that supports internal validation of smart cards and card readers based on industry standards for specific application types, including:
• Payment: Qualified solution to verify you payment applications - Used by EMVCo Laboratories
EMVCo Level 1 PCD Analog Test Suite
EMVCo Level 1 PCD Digital Test Suite
EMVCo Level 1 Reduced Range Terminal Analog Test Suite
EMVCo Level 1 PICC Analog Test Suite
EMVCo Level 1 PICC Digital Test Suite
EMVCo Level 1 Mobile Analog Test Suite
• ePassport & eID Products: Solution to verify your Identity Applications - Used by National Printing Companies
ISO 10373-6/ISO 18745-2 PICC Analog Test Suite
ISO 10373-6/ISO 18745-2 PICC Digital Test Suite
ePassport-eMRTD Application Test Suite
eID - Application EAC V2 & IAS ECC Test suites
eDL - Application ISO 18013-4 Test suite
• Access Control, Transport & Smart Objects: Solution to verify your Transport or Access Control Applications - Used by transport operators
ISO 10373-6 PICC Analog Test Suite
ISO 10373-6 PICC Digital Test Suite
ISO 10373-6 PCD Analog Test Suite
ISO 10373-6 PCD Digital Test Suite
• Mobile, Automotive Makers: Qualified solution to Verify your NFC Applications - Used by Mobile or automotive Makers
NFC Forum Poller&Listener Analog Test Suite
NFC Forum Poller&Listener Digital Test Suite
NFC Forum LLCP/SNEP test suite(Initiator/Target)
Current Products:NFC Forum Test Solutions
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