For cards and readers used in fare connection applications, KEOLABS provides off-the shelf solutions to verify conformity to relevant transport standards. KEOLABS ISO 10373-6 Analog & Digital Testing Solutions are available to user for "in house" evaluation of their products during development before engaging in a format certification, conformance verification standards ensure the ISO/IEC 14443 interoperability between a card/ticket/smart objects and a reader.
The ISO 10373-6 testing system provides the following testing suites:
ISO10373-6 PICC Analog test suite
ISO10373-6 PICC Digital test suite
ISO10373-6 PCD Analog test suite
ISO10373-6 PCD Digital test suite
For cards and readers used in fare connection applications, KEOLABS provides off-the shelf solutions to verify conformity to relevant transport standards.
KEOLABS ISO 10373-6 Analog & Digital Testing Solutions are available to user for "in house" evaluation of their products during development before engaging in a format certification, conformance verification standards ensure the ISO/IEC 14443 interoperability between a card/ticket/smart objects and a reader.
• ISO/IEC 10373-6 Test Methods
1 SCRIPTIS™ Test Environment
1 ISO 10373-6 PCD Analog test suite
1 ISO 10373-6 PCD Digital test suite
1 ProxiLAB QUEST tester with PCD Analog and Digital, PCD ALM, PCD VHBR
SC-PCD Assembly-4R7 (ISO PCD Assembly 1): ProxiLAB ISO 10373-6 High speed Test PCD Assembly (Rext 4,7 Ohm Version, latest ISO 10373-6 proposal). Used to perform Layer 2 ISO 14443 tests.
SC-PCD Assembly-2R7 (ISO PCD Assembly 2): High speed test PCD assembly class 4-6. PCD Antenna and sensing coils for high speed (RExt: 4.7 Ohm) testing of contactless smart cards according to ISO 10373-6
SC-RefPICC-KIT: 10373-6 PICC Reference probes, Classes 1-6. PICC reference probe kit with probes for classes 1 to 6 allowing testing of contactless readers according to ISO 10373-6 standards
Passive Refrence PICC(13.56MHz, 15MHz, 16.5MHz, 19MHz):
Active RefRence PICC:
1 Lecroy HDO 6034-B Oscilloscope with Xdev option
1 Amplifier 50W, 10-250 MHz
This PCD Analog test suite is compatible with the following standard: ISO/IEC 10373-6:2020 standard for Type A and Type B
Our coverage of this test specification includes the following test cases (numbering according
to the ISO/IEC 10373-6:2020):
ISO/IEC 14443-1 parameters tests:
• §6.1.1 - Alternating magnetic field test
ISO/IEC 14443-2 parameters tests:
• §7.1.1 – PCD field strength
• §7.1.4 - Modulation index and waveform
• §7.1.5 – Phase stability test
• §7.1.6 - Load modulation reception for PICC to PCD bit rates of fc/128, fc/64, fc/32 and fc/16
• §7.1.7 - Load modulation reception for PICC to PCD bit rates of fc/8, fc/4, and fc/2
• §7.1.8 - PCD EMD immunity test
This PCD Analog test suite is compatible with the following standard: ISO/IEC 10373-6:2020 standard for Type A and Type B
Our coverage of this test specification includes the following test cases (numbering according
to the ISO/IEC 10373-6:2020):
ISO/IEC 14443-3 and ISO/IEC 14443-4 parameters tests:
• §8.1.1 - PCD EMD recovery test
Type A specific tests:
• §H.2.1 - Frame Delay Time PICC to PCD
• §H.2.2 - Request Guard Time
• §H.2.3 - Handling of bit collision during ATQA
• §H.2.4 - Handling of anti-collision loop
• §H.2.5 - Handling of RATS and ATS
• §H.2.6 - Handling of PPS response
• §H.2.7 - Frame size selection mechanism
• §H.2.8 - Handling of Start-up Frame Guard Time
• §H.2.9 - Handling of the CID during activation by the PCD
• §H.2.10 - Handling of parity bit
Type B specific tests:
• §H.3.2 - Frame size selection mechanism
• §H.3.3 - Handling of the CID during activation by the PCD
• §H.3.4 - Frame Delay Time PICC to PCD (TR2)
• §H.3.5 - Handling of Start-up Frame Guard Time
• §H.3.6 - Type B PCD framing tests
Type A and Type B logical operations tests:
• §H.4.2 - Handling of the polling loop
• §H.4.3 - Reaction of the PCD to request for waiting time extension
• §H.4.4 - Error detection and recovery
• §H.4.5 - Handling of NAD during chaining
High bit rate selection tests:
• §I.3.1 – Procedure for Type A
• §I.3.2 – Procedure for Type B
• §I.3.3 – Procedure for bit rate selection using S(PARAMETERS) blocks
Scriptis supports Python editing and modifying scripts:
Scriptis saves test logs in TXT format:
Scriptis saves test logs in xgpa format:
Scriptis saves test logs in xdata format:
Scriptis supports exporting reports in PDF format:
Scriptis supports exporting reports in html format:
The Keolabs Solution by ABE supports verifying the following standards:
• EMV® Type Approval - Contactless Terminal Level 1
• EMV® Type Approval - Contactless Card Level 1
• NFC Forum Test Cases for Analog and Digital Protocol
• ISO/IEC 10373-6 Test Methods
• ISO/IEC 18745-2 Test Methods for the contactless interface
• CEN/TS 16794-2:2017 Public transport - Communication between contactless readers and fare media - Part 2: Test plan for ISO/IEC 14443
KEOLABS provides a complete testing solution that supports internal validation of smart cards and card readers based on industry standards for specific application types, including:
• Payment: Qualified solution to verify you payment applications - Used by EMVCo Laboratories
EMVCo Level 1 PCD Analog Test Suite
EMVCo Level 1 PCD Digital Test Suite
EMVCo Level 1 Reduced Range Terminal Analog Test Suite
EMVCo Level 1 PICC Analog Test Suite
EMVCo Level 1 PICC Digital Test Suite
EMVCo Level 1 Mobile Analog Test Suite
• ePassport & eID Products: Solution to verify your Identity Applications - Used by National Printing Companies
ISO 10373-6/ISO 18745-2 PICC Analog Test Suite
ISO 10373-6/ISO 18745-2 PICC Digital Test Suite
ePassport-eMRTD Application Test Suite
eID - Application EAC V2 & IAS ECC Test suites
eDL - Application ISO 18013-4 Test suite
• Access Control, Transport & Smart Objects: Solution to verify your Transport or Access Control Applications - Used by transport operators
ISO 10373-6 PICC Analog Test Suite
ISO 10373-6 PICC Digital Test Suite
ISO 10373-6 PCD Analog Test Suite
ISO 10373-6 PCD Digital Test Suite
• Mobile, Automotive Makers: Qualified solution to Verify your NFC Applications - Used by Mobile or automotive Makers
NFC Forum Poller&Listener Analog Test Suite
NFC Forum Poller&Listener Digital Test Suite
NFC Forum LLCP/SNEP test suite(Initiator/Target)
Current Products:ISO 10373-6 PCD Test Solutions
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