2018-09-11
艾北科技
632
2018年4月，在泰国曼谷召开的全球EMVCo大会上，EMVCo宣布将于2019年1月1日起全球实验室同步开展EMVCo 3.0的测试认证，包括EMV PICC/PCD Analog/Digital的所有非接触式卡片和非接触式终端读卡器将全部开展EMVCo 3.0的测试认证，并计划于2平9年1月1日停止受理EMVCo 2.6b版本的产品测试认证。
同时EMVCo发布了相关的规范，包括且不限于：
- Level 1 Test Equipment Specifications License Agreement Request (PICC Manual, PCD Manual, CMR Manual, Gerber Files)
- EMV® Level 1 Specifications for Payment Systems – EMV® Contactless Interface Specification
- EMV-Level-1-Contactless-Interface-Specification-V3.0-180423
- PCD-Analogue-Test-Bench-and-Test-Cases-v3.0a-final-draftVersion-20180410-without-changes-tracking
- PCD-Digital-Test-Cases-v3.0a_final_draft-20180410
- PCD-L1-Device-Test-Environment-v3.0a-Final-Draft-version-180411-without-changes-tracking
为了保持领先地位并成为第一批获得EMVCo 3.0资质的认证实验室，银行卡检测中心（以下简称BCTC）早早布局EMVCo 3.0测试系统升级的相关工作。
上海艾北科技有限公司（以下简称艾北科技）作为专业的测试工具供应商，与BCTC充分互动，进行了深入的技术沟通，介绍了Keolabs EMVCo 3.0的完整测试系统的技术特点，讨论了EMVCo 3.0测试系统的完整替换方案。
最终通过与EMVCo组织的充分沟通，通过对EMVCo 3.0测试规范更新状况的细节把控，通过对Keolabs测试认证系统的充分了解，在与法国Micropross（已被NI收购）和德国Comprion的充分了解后，BCTC最终选择通过艾北科技采购Keolabs完整的EMVCo 3.0测试系统。包括：
- EMVCo 3.0 PICC非接卡测试系统，3套
- EMVCo 3.0 PCD Analog非接终端读读卡器射频测试系统，4套
- EMVCo 3.0 PCD Digital非接终端读卡器协议测试系统，4套
艾北科技将鼎力支持BCTC完整EMVCo 3.0测试系统的顺利交付与及时过审，确保BCTC尽早获得EMVCo 3.0非接卡和非接终端读卡器的测试认证资质，确保BCTC尽早开展EMVCo 3.0测试认证服务，确保中国乃至亚洲的客户可以尽早到BCTC获得EMVCo 3.0测试服务。
银行卡检测中心（Bank Card Test Center, BCTC），国家金融IC卡安全检测中心，独立的第三方专业技术检测机构。BCTC是金融行业专业的检测机构，国家认可的国家级检测中心，是EMVCo、PCI、GlobalPlatform等国际支付卡标准化组织及中国银联、VISA和MasterCard等国内外支付组织的国际检测实验室，可为全球银行卡和电子支付产业提供技术服务。
艾北科技是一家专业的仪器代理分销商和IP核服务商，代理销售Keolabs, Galitt, Ellisys, Secure-IC等多家公司仪器设备及安全IP核。艾北科技提供EMVCo, NFC Forum, ISO 14443, ISO 15693, ICAO e-passport, GlobalPlatform, TEE, USB/Bluetooth/WIFI Analyzer, SCA/FIA等多种测试工具及芯片安全IP核。
Keolabs是法国一家专业的智能卡和读卡器测试工具供应商，专注于Level 1 Analog/Digital测试方案，提供EMVCo, NFC Forum, ISO 14443, ISO 15693, ICAO e-passport, ETSI SWP, e-driving License, CIPURSE, Cen/TS 16794等与智能卡和读卡器Level 1相关的测试需求。提供接触和非接触式的卡和读卡器的研发测试工具、抓包解析工具、测试认证系统。
Keolabs EMVCo 3.0非接测试系统是第一个获得EMVCo 3.0认证证书的测试系统，基本测试系统图片如下：
PICC Analog 3.0
• 3 New EMV Test PICCs compared to 1 previously
• CAB111 - Verifying the PICC influence on the Field
o From CAB111.000 to CAB111.zrf
o New testing procedure: 3 different values for z compared to 1 previously
• CA134 - Verifying the Type A PICC Detectable Disturbances
o New testing procedure in case of Fail due to a single monotonic change in the level of the envelope of the carrier
• CB122 - Verifying the PICC Responsiveness at Maximum Field Intensity
o Test at Nominal and Minimal Modulation index (test only at Nominal Modulation index with the previous version)
• CB134 - Verifying the Type B PICC Detectable Disturbances
o New testing procedure in case of Fail due to a single monotonic change in the level of the envelope of the carrier
PICC Digital 3.0
• CA001 / CA002 / CA003 - Basic Type A Exchange and Timings Measurement
o Update the test case to check that:
all ATQA received before the field reset are equal
all ATQA received after the field reset are equal
ATQA before and after the field reset can differ
• CA010 - Basic Type A Exchange with the minimum and longer Frame Delay Times PCD to PICC
o Replace th by tp in scenario
• CA0126 / CA0127 / CA128 - Type A Consecutive Installations
o Add steps in scenario
• CA230 / CA231 / CA232 - Type A Installation with error in the HALT state following PROTOCOL State
o Add steps in scenario
• CA233 - Type A Installation with polling and with PICC Reset
o implement the new scenario according to the repetition on 'y' parameter
• CB001 - Basic Type B Exchange and Timings Measurement
o Update the test case to check that:
all ATQB received before the field reset are equal
all ATQB received after the field reset are equal
ATQB before and after the field reset can differ
• CB126- Type B Consecutive Installations
o Add steps in scenario
• CB227- Type B Installation with error in the HALT state following the ACTIVE State
o Add steps in scenario
• CB233 - Type B Installation with polling and with PICC Reset
o implement the new scenario according to the repetition on 'y' parameter
• CC110 - Reception of chained I-Blocks from the PCD
o New iteration with x=7
• CC203 - Error notification on an I-Block not indicating chaining
o Add timing checking between R(NAK) block and retransmitted S(WTX)
• CC206 - Error after reception of a non-chained I-Block
o Add timing checking between R(NAK) block and retransmitted S(WTX)
o Add a selection for CC206.13
• CC207 - Management of b2 in the PCB of S-Blocks
o Update scenario with the new description and the S(PARAMETERS) error generation
• CC210 - Error notification and error after reception of a chained I-Block
o Update selection for CC210.6
PCD Analog 3.0
• 3 New EMV Test PICCs compared to 1 previously
• TAB111 - Verifying the PCD to PICC Power Transfer
o Test case performed with the 3 new EMVCo Test PICCs
• TAB113 - Verifying the PCD Operating Field Resetting
o New testing procedure using an ISO10373-6 Iso Coil 1 instead of EMV Test PICC
• TAB114 - Verifying the PCD Power-Off of the Operating Field
o New testing procedure using an ISO10373-6 Iso Coil 1 instead of EMV Test PICC
• TA121 to TA128 - PCD to PICC Signal Interface for Type A Communications
o Waveforms measurement test cases performed with the 3 new EMVCo Test PICCs and the 2 linear loads
• TA131 to TA138 - PICC to PCD Signal Interface for Type A Communications
o PCD Sensitivity test cases performed with the 3 new EMVCo Test PICCs
• TB121 to TB127 - PCD to PICC Signal Interface for Type B Communications
o Waveforms measurement performed with the 3 new EMVCo Test PICCs and the 2 linear loads
• TB131 to TB138 - PICC to PCD Signal Interface for Type B Communications
o PCD Sensitivity test cases performed with the 3 new EMVCo Test PICCs
• TB142 - Verifying the Synchronization, Bit Coding and De-synchronization of PCD to PICC
o Test case pass criteria updated with the usage of EMVCo Test PICC 1 only
• TB146 - Verifying the Synchronization, Bit Coding and De-synchronization of PICC to PCD
o test case from EMVCo 2.6b deleted
PCD Digital 3.0
• TA003 - Basic Type A Exchange with the minimum and the default maximum Frame Delay Time PCD to PICC
o update scenario exchange
• TA202 - Type A Error free chained I-Blocks in both directions for FSC = 256 bytes
o update scenario exchange
o add test case selection according to the FSCI
• TA203 - Type A Error free chained I-Blocks transmission for FSC = 16 to 128 bytes
o add acceptance criteria on FDT,PCD R(ACK) block
o update data exchanged
o add a new subcase for x=9 (FSC=256)
• TA206 - Type A Error free chained I-Blocks in both directions with different values of FSD
o New test case
• TA404 - Type A Protocol error in response to an I-Block not indicating chaining
o add new subcase
• TA408 - Type A Protocol error in response to an I-Block indicating chaining
o add new subcase
• TA411 - Type A Protocol error in response to an R(ACK) Block
o add new subcase
• TB004 - Basic Type B Exchange with the minimum and the default maximum Frame Delay Time PCD to PICC
o update scenario exchange
• TB202 - Type B Error free chained I-Blocks in both directions for FSC = 256 bytes
o add test case selection according to different values of FSCI
• TB203 - Type B Error free chained I-Blocks transmission for FSC = 16 to 128 bytes
o add acceptance criteria on FDT,PCD R(ACK) block
o update data exchanged
o add a new subcase for x=8 (FSC=256)
• TB206 - Type B Error free chained I-Blocks in both directions with different values of FSD
o New test case
• TB404 - Type B Protocol error in response to an I-Block not indicating chaining
o add new subcase
• TB408 - Type B Protocol error in response to an I-Block indicating chaining
o add new subcase
• TB411 - Type B Protocol error in response to an R(ACK) Block
o add new subcase
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